Manufacturer Part | SN74ABTH18646APM |
---|---|
Manufacturer | Texas Instruments |
Description | IC SCAN-TEST-DEV/TXRX 64-LQFP |
Category | Integrated Circuits (ICs) |
RoHS | Lead free / RoHS Compliant |
Warranty | 365 days |
Availability | 160 pieces |
Shipped from | HK warehouse |
Expected Shipping | Nov 29 - Dec 03 2024 |
In Stock Min.: 1 Mult.: 1
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Type | Description |
---|---|
Series: | 74ABTH |
Package: | Tray |
Part Status: | Active |
Logic Type: | Scan Test Device With Transceivers And Registers |
Supply Voltage: | 4.5V ~ 5.5V |
Number of Bits: | 18 |
Operating Temperature: | -40°C ~ 85°C |
Mounting Type: | Surface Mount |
Package / Case: | 64-LQFP |
Supplier Device Package: | 64-LQFP (10x10) |
Payment method | Hand Fee |
Telegraphic Transfer | Request service |
Paypal | 4% fee |
Credit Card | 4% fee |
Western Union | Free of charge |
Money Gram | Free of charge |
Shipping Type | Lead Time |
DHL | 2-5 days |
Fedex | 2-5 days |
UPS | 2-5 days |
TNT | 2-6 days |
EMS | 3-7 days |
Registered Air Mail | 20-35 days |